【APC discount】IEEE (Institute of Electrical and Electronics Engineers) provides a 10% APC (Article Processing Charge) fee discount for teachers and students of our school to submit OA (Open Access) papers in IEEE journals. Teachers and students of our school, as corresponding authors, can use this discount when submitting manuscripts in IEEE full OA journals, or when they choose OA mode for IEEE hybrid journals. Teachers and students should pay attention to the correct association of the school-level account in the system when filling in the institution of the corresponding author: Zhejiang University, in order to use this discount correctly. Please refer to the attached document for the specific usage process. Offer valid from now until December 31, 2022. If you have any questions, please contact iel@igroup.com.cn.
【Off-campus Access】Provide the following 2 ways:
1. For access based on identity authentication, do not use RVPN to avoid access failure. If you have any questions, please contact the Information Technology Center 0571-87951669.
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Visit website: https://ieeexplore.ieee.org/servlet/wayf.jsp?entityId=https://idp.zju.edu.cn/idp/shibboleth&url=https%3A%2F%2Fieeexplore.ieee.org, you can access the database after passing the identity authentication.
(2) Visit website: https://ieeexplore.ieee.org/, (a) After selecting “Institutional Sign In” at the top of the homepage, click “Shibboleth” on the right; (b) Enter the English name of the school in the search box (Zhejiang University) to search; (c) Click on the search result "Zhejiang University" to jump to "Zhejiang University unified identity authentication". After passing the identity authentication, you can access the database.
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Remote Access method: Register an account in the school network and bind the device in the school network. It can be used for 90 days after binding. Refer to the IEEE Xplore platform off-campus access operation guide.
The IEEE Xplore platform currently supports the download of the entire issue of some journals, as well as batch download of documents on the search page (up to 10 entries each time).
The following content ordered by the library can be accessed on the IEEE Xplore search platform:
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IEEE Electronic Library (IEL for short): Provides full texts of periodicals, conference proceedings, and standards published by IEEE (Institute of Electrical and Electronics Engineers) since 1988, and some historical documents dating back to 1872. The content covers electrical and electronic, aerospace, computer, communication engineering, biomedical engineering, robotics automation, semiconductors, nanotechnology, electric power, and other technical fields. Brief introduction:
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190 IEEE journals, conference proceedings, and magazines.
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More than 1,700 IEEE conference proceedings per year.
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More than 3,900 IEEE current and archived standards.
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The "Engineering Management Review, IEEE" and "Electronic Materials, IEEE/TMS Journal of" in the IEEE journals do not belong to the IEEE copyright, so full-text PDF downloads are not provided, only abstracts are provided.
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IBM Journal of Research and Development: an authoritative journal jointly launched by IEEE and IBM (this journal merges with another journal, IBM Systems Journal 1962-2008). Both journals have undergone peer review and have been reviewed in science, technology, and information. The leading position in systems engineering and other fields can be traced back to 1957.
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Bell Labs Technical Journal (1922-)
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Morgan & Claypool Summary Anthology Engineering and Computer Science Anthology 1-7
IET Publishing has converted all journal content published from 2013 to the present to an OA open access model and will provide access through the Wiley platform from January 2021. IET’s original 29 journals are included in the IEL database, 28 of which will be converted into OA journals from 2021. The flagship journal IET E&T (Engineering & Technology) remains in the IEL database and can continue to be accessed through the IEEE Xplore platform. The contents of the IET conference proceedings can continue to be accessed through the IEEE Xplore platform.